Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Siemens plans to integrate Aster's advanced "shift-left" design for test functionality into Siemens' Xpedition and Valor ...

This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...

Hardware and software advances address higher performance demands and accelerated design cycles. Driven by higher speed and data demands of advanced applications such as electric vehicles and ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

1. Nilesh Kamdar addressed simulation, interoperability testing, and managing chiplet data in his presentation. Artificial intelligence (AI) has become central to EDA design optimization and debugging ...

Understand why testing must evolve beyond deterministic checks to assess fairness, accountability, resilience and ...