Plug & Play: the hybrid probe card UFO Probe® Card can be integrated into existing standard IC wafer probers without much effort. Picture made by Tobias Gnausch, Jenoptik. Plug & Play: the hybrid ...
The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...
FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results